Dear PATSTAT users,
Please note that OECD's complementary patent datasets - Triadic Patent Families, Citations, REGPAT and HAN -have been updated, using PATSTAT, April 2013.
Note that an additional dataset is now available: the OECD Patent Quality Indicators database, July 2013, which provides a list of patent-quality related indicators compiled at the level of the patent document.
The above mentioned datasets can be downloaded upon request.
The OECD REGPAT database, July 2013 edition, allocates applicant's and inventor's addresses to micro-regions for most OECD and EU28 countries, plus the BRICS countries. It covers patent applications filed to the EPO and PCT patents at international phase. Data mainly derives from PATSTAT, April 2013. The regional allocation is based on the latest Nomenclature of Territorial Units for Statistics (NUTS), for European regions, and on Territorial Level 3 for other countries. Note that for EU-28 countries, the REGPAT database now integrates data regionalised by the Katholieke Universiteit Leuven (KUL, INCENTIM/ECOOM) on behalf of Eurostat.
The OECD Triadic Patent Families (TPF), July 2013 edition, covers patent applications filed to the European Patent Office (EPO), the Japan Patent Office (JPO) and granted by the US Patent and Trademark Office (USPTO) that share a same set of priorities. The data was compiled using PATSTAT, April 2013.
The OECD Citation database, July 2013 edition, covers citations of patent and non-patent literature (NPL) in patents taken at the EPO or filed through the PCT. The data is derived from PATSTAT, April 2013. The OECD Citation database mainly relies on the previous structure proposed in Webb et al. (2005). In addition to the list of cited patents and NPL, it proposes a list of EP or WO equivalents to cited patents, in order to facilitate further consolidation of the citation counts.
The OECD HAN database, July 2013 edition, provides a grouping of patent applicants names resulting from a cleaning and matching of names (from PATSTAT, PERSON table). Names of applicants were originally extracted from October 2011, and the results were propagated to the latest editions of PATSTAT, April 2012, October 2012 and April 2013.
NEW! The OECD Patent Quality Indicators database, July 2013 edition, proposes a number of indicators that are aimed at capturing the quality of patents, intended as the technological and economic value of patented inventions, and the possible impact that these might have on subsequent technological developments. The current version of the dataset only relies on patent applications filed at the European Patent Office (EPO), but coverage will likely be expanded in the future, to include patents filed to other offices. The database is intended for use in combination with the latest version PATSTAT, April 2013. The dataset contains 19 individual indicators at the patent document level, as well as some cohort specific statistics useful for normalising, aggregating and comparing the indicators. More details are provided in:
Squicciarini, M., H. Dernis and C. Criscuolo (2013), "Measuring Patent Quality: Indicators of Technological and Economic Value", OECD Science, Technology and Industry Working Papers, No. 2013/03, available at : http://dx.doi.org/10.1787/5k4522wkw1r8-en.
All the above mentioned datasets include links to PATSTAT's identifiers (either Person_id, Appln_id, NPL_publn_id), so that it can be easily connected to PATSTAT April 2013.
The datasets are available for download to researchers: please send an e-mail to email@example.com to request access (mention OECD patent database in the title, and specify the name of the dataset you're interested in). Further methodological information are available on the OECD web site at http://www.oecd.org/sti/ipr-statistics.
Furthermore, note that predefined indicators on patents are provided on the OECD statistics portal at http://stats.oecd.org/ , both at regional and country levels, for selected technology domains (ICT, Biotech, Nanotech, Environmental related technologies).
Here you can post your opinions, ask questions and share experiences on the PATSTAT product line. Please always indicate the PATSTAT edition (e.g. 2015 Autumn Edition) and the database (e.g. PATSTAT Online, MySQL, MS SQL Server, ...) you are using.
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